MIL-DTL-38449D
c. Functional test (4.4.3).
d. Ripple test (see 4.4.4).
e. Transient sensitivity (see 4.4.5).
f. Transient and noise susceptibility (see 4.4.6).
g. Vibration (see 4.4.7.8).
h. Life (see 4.4.8).
i. Radio frequency interference (see 4.4.9).
Amplifier units No. 3 and No. 4 shall be provided to the qualifying activity for flight evaluation
as specified in 4.5. Units No. 3 and No. 4, prior to submission, shall have successfully
completed the individual inspections as specified in 4.3.1.
4.3 Quality conformance inspection. Quality conformance inspection shall consist of the
individual inspections described below:
4.3.1 Individual inspections. Each amplifier shall be subjected to the following examination and
tests as described under 4.4:
a. Examination of product (see 4.4.1).
b. Dielectric strength (see 4.4.2).
c. The following functions tests of 4.4.3 as specified in Table III:
(1) High voltage steps 1 through 8 only.
(2) Low voltage steps 1 through 8 only of the high voltage test.
(3) False operation (diode) test.
(4) Current consumption.
(5) Transmitter tests (classes 3 and 4 at 1,000 Hz only).
(6) Receiver test (classes 3 and 4 at 1,000 Hz only).
(7) Intercom loading (classes 3 and 4 at 1,000 Hz only).
d. Noise susceptibility (see 4.4.6.2).
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