MIL-DTL-38449D
b. Test samples The samples that were tested
c. Drawings Two complete sets of outline and electrical schematics identifying all
electrical components and values, such as resistor, 2 ohms, etcetera.
4.2.3 Qualification examinations and tests. A qualification test outline, as well as procedures
and test setups, shall be submitted to the qualifying activity for the amplifier being tested. Upon
receipt of written approval from the qualifying activity, the manufacturer may then proceed with
the testing portion of qualification. The qualification inspection shall consist of all the
examinations and tests described under 4.4 and shall be conducted in the sequence listed below
(see 6.3):
Amplifier Unit No. 1
a. Examination of product (see 4.4.1).
b. Dielectric strength (see 4.4.2).
c. Functional test (see 4.4.3).
d. Ripple test (see 4.4.4).
e. Transient sensitivity (see 4.4.5).
f. Transient and noise susceptibility (see 4.4.6).
g. High temperature (see 4.4.7.1).
h. Low temperature altitude (see 4.4.7.2).
i. Fungus (see 4.4.7.3).
j. Salt fog (see 4.4.7.4).
k. Humidity (see 4.4.7.5).
l. Shock (see 4.4.7.6).
m. Immersion (leakage) (see 4.4.7.7).
Amplifier Unit No. 2
a. Examination or product (see 4.4.1).
b. Dielectric strength (see 4.4.2).
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